Diagnostics

Scanning Autocorrelators

Input wavelength range Input pulse duration Sensitivity Input rep. rate Temporal resolution
AA-DD 450-3200 nm 10 fs - 30 ps 100 mW^2 >10 Hz 0.09...1.22 fs
AA-M 450-2000 nm 20 fs - 12 ps 100 mW^2 >10 kHz 0.16...0.64 fs
IRA 450 nm - 11 um 50 fs - 250 ps from 1 W^2 from 10 Hz 8.3 fs

Single-Shot Autocorrelators

Input wavelength range Input pulse duration Sensitivity Input rep. rate Temporal resolution
ASF 400-2200 nm 5 fs...20 ps 1 uJ in single-shot mode single...150 MHz 2.3...4 fs

SPIDER

Input wavelength range Input pulse duration Sensitivity Input rep. rate Spectrometer
SPIDER 550-1100 nm 5-320 fs 100 mW or 1 uJ any built-in 2-channel

Third-Order Cross-Correlators

Input wavelength range Scan range Sensitivity Dynamic range Delay resolution
COMET 700-1500 nm up to 4 ns 50-100 uJ 10^10 100 fs

Spectrometers

Spectral range Spectral resolution Dynamic range Focal distance Dimensions
ASP-150 190-1100 nm 0.017...0.6 nm 1000:1 150 mm 205...242x115x76 mm
ASP-IR 500-1700 / 900-2600 / 1200-3450 nm 0.5...1.2 nm 3x10^5...6x10^4 150 mm 225...295x136x81 mm

Latest News

The TiF-100ST-F18-AU femtosecond high-power titanium-sapphire oscillator

Ti:S oscillator with up to 3 W output power at 100 fs

We have ramped up the maximum available output power for the TiF-100 series to more than 3 Watts at 800 nm, 100 fs, 80 MHz. The tuning range has also been extended to 720-950 nm, while an optional modification that covers 850-1040 nm is also available. The system features a high-power low-noise integrated DPSS laser […]

TiF-100ST-F6 femtosecond Ti:S oscillator with Frep locking for multiphoton microscopy at CANDLE, Armenia

The TiF-100ST-F6 femtosecond Ti:S oscillator with a built-in pump laser, also equipped with the ALock PLL electronics unit for pulse repetition rate locking to an external RF source has been installed at the Synchrotron Research Institute’s CANDLE facility in Armenia. The setup has been developed and commercialized during the joint Russia-Armenia project supported by FASIE (Innovation […]

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